E0004
Zinc Ions And Zinc Sulfide Particles In Gamma-Zirconium
Phosphate: Synthesis, X-Ray Characterization. aC. Ferragina,
aR. Di Rocco and bL. Petrilli,
CNR-aIMIP, bISM, via Salaria Km. 29.300, 00016
Monterotondo (Rome) Italy.
Many methods have been applied to prepare semiconductor
clusters and their encapsulation in layered structure as IV group phosphates is
of increasing importance as a route to the structural control of chemical
reactions. This paper describes the synthesis and X-ray characterization of
gamma-zirconium phosphate, (gamma-ZrP), an inorganic ion-exchanger, with zinc
sulfide formed particles in situ (gamma-ZrPZnS). The aim of this work was
to obtain semiconductors supported. By using the hydrothermal synthesis a fully
exchanged material has been obtained (gamma-ZrPZn) with a layered structure. Its
interlayer distance d is a little decreased with respect to that of the
starting material (11.80Å vs. 12.30Å respectively). The X-rays
patterns of the zinc material heated at dehydration different temperatures show
that up to 320°C is evident a decrease of d (11.80Å vs.
9.82Å). Up to 750°C, when the dehydration is complete, the material
is still layered with d of 9.61Å. At 1100°C a syntherization
is evident in the TG-DTA curve and the X-ray patterns are that of zinc-zirconium
double phosphate.
A form with half zinc exchanged ions has been also prepared
(gamma-ZrPZn0.5) showing in the X-ray patterns the reflections due
both to the gamma-ZrP and to the gamma-ZrPZn. At 1100°C the X-ray
diffractogram of this material shows two phases: zirconium zinc double phosphate
and zirconium pyrophosphate.
The completely dehydrated gamma-ZrPZn was submitted to the
H2S gas flow for several hours. As a results ZnS particles are formed
in the gamma-ZrP host matrix. Both the X-ray patterns and microanalysis
measurements show evidence of this. The gamma-ZrPZnS diffractogram is similar to
those of its precursor gamma-ZrP, with extra reflections due to the ZnS
particles.