W0073

Microfocusing Source and Multilayer Optics Based X-Ray Diffraction Systems. Bonglea Kim, Boris Verman, Srivatsan Seshadri, Yuriy Platonov and Licai Jiang, Osmic, Inc., 1900 Taylor Rd., Auburn Hills, MI 48326.

Microfocusing source and multilayer optics based diffraction systems represent a new way of forming x-ray beam. These systems offer not only the attractiveness of a sealed tube based system, such as low cost of total ownership and easy maintenance, but also high performance for some applications which need a highly defined probing beam. The technique has matured over the year’s effort in development. Both the performance and the reliability have reached a satisfactory level. The systems are available for both Cu and Mo radiation. We will present the application of such systems to small molecular crystallography, high pressure, and small angle x-ray scattering. Detailed comparisons are made between the microfocusing source and multilayer optics based systems and the currently available systems, of which most are rotating anode based systems. The reliability issue, such as stability and life time, will also be addressed.