W0341

Nanocrystallography: The Sstudy of Nanostructured Materials. Simon J.L. Billinge,^a Valeri Petkov,^b Thomas Proffen,^c Mercouri Kanatzidis,^d Emil Bozin^a and Xiangyun Qiu^a, ^aDept. of Physics and Astronomy, Michigan State University, East Lansing, MI 48824, and ^bDept. of Physics, Central Michigan Univ., Mt. Pleasant, MI 48859, ^cManuel Lujan Jr. Neutron Scattering Center, Los Alamos National Laboratory, LANSCE-12, MS H805, Los Alamos, NM 87545, ^dDept. of Chemistry, Michigan State Univ., East Lansing, MI 48824.

There is a general relationship between the structural complexity of the material and the uniqueness of its function. One thing these functional materials share in common is the presence of meaningful structures on the nanometer length-scale. One of the great challenges facing us is to characterize these nanostructues both quantitatively and reliably. We will describe x-ray and neutron total-scattering approaches, referred to as “nanocrystallography”, we are using to address this problem. We will mention recent progress in studying nanostructures of transition-metal oxides and chalcogenides, III-V and II-VI electronic materials, Cs ions intercalated in nanoporous hosts and alumino-silicate glasses.