W0452
Unlock Your Unsolvable Powder Diffraction Patterns: An
Introduction of A Novel Indexing Program X-Cell. C. Liang, M. Neumann, G.
Engel, Accelrys Inc., 9685 Scranton Rd., San Diego, CA 92121.
X-Cell1 is a novel and robust indexing algorithm
which employs an extinction-specific dichotomy procedure to perform an
exhaustive search of parameter space to establish a complete list of all
possible solutions. It can handle medium- to- high quality powder diffraction
data obtained from X-ray, neutron, and electron radiation sources. X-Cell is the
first indexing program to use explicit impurity tolerance levels to specify the
maximum number of unindexed reflections. The dominant phase of mixtures can be
indexed in the presence of up to 50% impurity peaks if high-quality synchrotron
data are available. X-Cell searches from low to high peak numbers while
explicitly considering systematic absences; thus providing for the correct unit
cell to be found earlier. For a given range of allowed calculated peak numbers,
a pattern of systematic absences, and an impurity tolerance level, an exhaustive
search is performed. Zero-point shift is determined along with unit cell
parameters. All indexing solutions are fully optimized and ranked according to a
special figure of merit Fr, which favors solutions with low numbers
of calculated peaks, adjustable parameters, and impurity peaks. Indexing of long
and flat unit cells is facilitated by searching for rows (1D) or zones (2D) in
reciprocal space first and then the search is refined using the lattice
parameters of the dominant row or zone in the final unit cell (3D) search in
combination with a modified Pawley refinement5. Initial
validation1 indicated that X-Cell has a higher success rate (92%)
than DICVOL2 (46%), TREOR3 (46%), and ITO4
(33%) for 24 cases. X-Cell copes very well with various difficulties typically
encountered in powder indexing. Implementation of the successive dichotomy
approach is significantly more efficient in X-Cell than in
DIVOL1.
1M.A. Neumann, J. Appl. Cryst. 2003,
36, 356-365.
2A. Boultif and D. Louer, J. Appl. Cryst.
1991, 24, 987-993.
3P.E. Werner, L. Ericksson and M. Westdahl, J.
Appl. Cryst. 1968 1, 108-113.
4J.W. Visser, J. Appl. Cryst. 1969,
2, 89-95.